Using regression method in RF MEMS test & diagnostic
NGUYEN Hoang Nam, MIR Salvador
5th Vietnamese National Conference on Metrology, Volume 2010 - May 2010
BibTex references
@Article{NM10a,
author = {NGUYEN, H. and MIR, S.},
title = {Using regression method in RF MEMS test \& diagnostic},
journal = {5th Vietnamese National Conference on Metrology},
volume = {2010},
month = {May},
year = {2010},
url = {/2010/NM10a},
}