Using regression method in RF MEMS test & diagnostic

NGUYEN Hoang Nam, MIR Salvador
5th Vietnamese National Conference on Metrology, Volume 2010 - May 2010

BibTex references

@Article{NM10a,
  author       = {NGUYEN, H. and MIR, S.},
  title        = {Using regression method in RF MEMS test \& diagnostic},
  journal      = {5th Vietnamese National Conference on Metrology},
  volume       = {2010},
  month        = {May},
  year         = {2010},
  url          = {/2010/NM10a},
}

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